US 12,334,175 B2
Differential strobe fault indication
Scott E. Schaefer, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Jul. 11, 2022, as Appl. No. 17/862,082.
Claims priority of provisional application 63/348,303, filed on Jun. 2, 2022.
Prior Publication US 2023/0395182 A1, Dec. 7, 2023
Int. Cl. G11C 29/50 (2006.01); G11C 7/22 (2006.01); G11C 29/02 (2006.01); G11C 29/52 (2006.01)
CPC G11C 29/52 (2013.01) [G11C 7/22 (2013.01); G11C 29/023 (2013.01)] 22 Claims
OG exemplary drawing
 
1. A method, comprising:
receiving, at a memory device, one or more commands to perform one or more operations on a memory array of the memory device;
determining, at the memory device, a fault associated with performing the one or more operations;
indicating, by the memory device, a plurality of clock cycles for outputting data associated with a first command of the one or more commands using a first read strobe signal of a set of read strobe signals; and
indicating, by the memory device, the fault using a second read strobe signal of the set of read strobe signals, wherein the fault is indicated according to a timeout duration that is based at least in part on a characteristic of the fault.