US 12,334,172 B2
Link evaluation for a memory device
Markus Balb, Ottobrunn (DE); Thomas Hein, Munich (DE); and Heinz Hoenigschmid, Poecking (DE)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Feb. 22, 2023, as Appl. No. 18/112,830.
Application 18/112,830 is a continuation of application No. 17/121,314, filed on Dec. 14, 2020, granted, now 11,615,862.
Claims priority of provisional application 62/950,851, filed on Dec. 19, 2019.
Prior Publication US 2023/0197181 A1, Jun. 22, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 29/44 (2006.01); G06F 3/06 (2006.01); G06F 13/16 (2006.01); G06F 13/42 (2006.01); G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/38 (2006.01); G11C 29/50 (2006.01); H04L 7/00 (2006.01); H04L 7/033 (2006.01)
CPC G11C 29/44 (2013.01) [G06F 3/061 (2013.01); G06F 3/0659 (2013.01); G06F 13/1689 (2013.01); G06F 13/4243 (2013.01); G11C 29/023 (2013.01); G11C 29/12005 (2013.01); G11C 29/38 (2013.01); G11C 29/50012 (2013.01); H04L 7/0008 (2013.01); H04L 7/033 (2013.01); G06F 13/1694 (2013.01); G11C 2207/2254 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method, comprising:
sampling, at a first device, a first signaling received via a channel based at least in part on a first reference point within a time domain and a voltage domain to obtain data associated with the first signaling, wherein the first reference point is at a first sampling time within a sample period;
sampling, at the first device, a second signaling received via the channel and associated with a first sequence of logic values based at least in part on a second reference point within the time domain and the voltage domain to obtain a second sequence of logic values, wherein the second reference point is at a second sampling time within the sample period; and
transmitting, by the first device, a third signaling based at least in part on the second sequence of logic values and the first sequence of logic values.