US 12,334,169 B2
Scheme to fetch optimal read parameters by skipping invalid wordlines
Darshan Pagariya, Bangalore (IN); and Vishal Sharma, Bangalore (IN)
Assigned to SANDISK TECHNOLOGIES, INC, Milpitas, CA (US)
Filed by WESTERN DIGITAL TECHNOLOGIES, INC., San Jose, CA (US)
Filed on Oct. 25, 2023, as Appl. No. 18/383,820.
Prior Publication US 2025/0140331 A1, May 1, 2025
Int. Cl. G11C 29/12 (2006.01)
CPC G11C 29/12005 (2013.01) [G11C 2029/1202 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A storage device to obtain and update an optimal parameter associated with a Thermal Region Tag (TRT) assigned to a group of blocks programmed at a given temperature range, the storage device comprises:
a memory device including blocks to store data; and
a controller to assign a TRT to blocks programmed at a given temperature range and update an optimal TRT parameter associated with the TRT by obtaining a set of representative wordlines and a set of indicative wordlines for a block assigned to the TRT, performing a bit error rate (BER) estimation on indicative wordlines in the set until a valid indicative wordline is found, determining whether to perform a BER Estimation Scan (BES) check when the valid indicative wordline is found, in performing the BES check, performing the BER estimation on representative wordlines in the set until a valid representative wordline is found, and when valid representative wordline is found, obtaining and updating the optimal TRT parameter based on the representative wordline.