US 12,334,166 B2
Data integrity checks based on voltage distribution metrics
Vamsi Pavan Rayaprolu, Santa Clara, CA (US); Michael Sheperek, Longmont, CO (US); and Christopher M. Smitchger, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Sep. 27, 2023, as Appl. No. 18/373,741.
Application 18/373,741 is a continuation of application No. 17/123,993, filed on Dec. 16, 2020, granted, now 11,810,631.
Prior Publication US 2024/0021258 A1, Jan. 18, 2024
Int. Cl. G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/44 (2006.01); G11C 29/50 (2006.01)
CPC G11C 29/021 (2013.01) [G11C 29/12005 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01); G11C 2207/2254 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled to the memory device, to perform operations comprising:
determining a value of a data state metric of a memory page, wherein the data state metric value is reflective of a number of bit errors associated with the memory page;
upon determining that the data state metric value satisfies a threshold criterion, providing, to a neural network, at least two different voltage distribution metrics values currently associated with the memory page, wherein each voltage distribution metrics value reflects one of a voltage distribution margin, a voltage distribution floor, or a voltage distribution center; and
obtaining, from the neural network, a recommendation to trigger a media management operation with respect to a block associated with the memory page.