US 12,333,969 B2
System and method for inspecting display device having input sensor
Il Ho Lee, Yongin-si (KR); Taejoon Kim, Yongin-si (KR); Jinwoo Park, Yongin-si (KR); Yerin Oh, Yongin-si (KR); Seungrok Lee, Yongin-si (KR); and Wankee Jun, Yongin-si (KR)
Assigned to SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do (KR)
Filed by SAMSUNG DISPLAY CO., LTD., Yongin-si (KR)
Filed on Oct. 31, 2023, as Appl. No. 18/498,658.
Claims priority of application No. 10-2023-0005819 (KR), filed on Jan. 16, 2023.
Prior Publication US 2024/0242645 A1, Jul. 18, 2024
Int. Cl. G09G 3/00 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); G09G 3/3208 (2016.01)
CPC G09G 3/006 (2013.01) [G06F 3/0412 (2013.01); G06F 3/04166 (2019.05); G06F 3/0418 (2013.01); G06F 3/0446 (2019.05); G09G 3/3208 (2013.01); G09G 2354/00 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An inspection system comprising:
at least one display device product comprising a display panel and an input sensor; and
an inspection device comprising:
an inspection signal generator configured to provide to the display panel an inspection signal indicative of a first image pattern;
a memory configured to store a reference signal responsive to a second image pattern; and
a noise detector configured to receive from the input sensor a sensing signal responsive to the first image pattern, detect a first noise based on the sensing signal, and detect a second noise based on the reference signal,
wherein the inspection device determines a defect of the display device product based on the first noise and the second noise,
wherein the reference signal is a sensing signal from the input sensor of a previous non-defective display device product responsive to an inspection signal indicative of the second image pattern,
wherein the noise detector calculates the second noise based on the sensing signal and the reference signal.