US 12,333,386 B2
Tunable interactions for implementing two-qubit gates, and extensible circuits built therefrom
Agustin Di Paolo, Cambridge, MA (US); William D. Oliver, Lexington, MA (US); Catherine Leroux, Sainte-Julie (CA); and Alexandre Blais, Sherbrooke (CA)
Assigned to Massachusetts Institute of Technology, Cambridge, MA (US); and SOCPRA SCIENCES ET GENIE S.E.C., A/S TransferTech Sherbrooke, Sherbrooke (CA)
Filed by Massachusetts Institute of Technology, Cambridge, MA (US); and SOCPRA SCIENCES ET GENIE S.E.C., A/S TransferTech Sherbrooke, Sherbrooke (CA)
Filed on Oct. 21, 2022, as Appl. No. 18/048,574.
Claims priority of provisional application 63/292,634, filed on Dec. 22, 2021.
Claims priority of provisional application 63/328,947, filed on Apr. 8, 2022.
Prior Publication US 2024/0346350 A1, Oct. 17, 2024
Int. Cl. G06N 10/40 (2022.01); G06N 10/00 (2022.01); H10N 60/12 (2023.01)
CPC G06N 10/40 (2022.01) [G06N 10/00 (2019.01); H10N 60/12 (2023.02)] 13 Claims
OG exemplary drawing
 
1. A system comprising:
a first qubit associated with a first resonant frequency;
a second qubit associated with a second resonant frequency;
a qubit coupler inductively or capacitively coupling the first qubit to the second qubit according to a ZZ interaction strength; and
a microwave driver for driving the qubit coupler with microwaves according to a driver power and a third driver frequency that is different than the first resonant frequency and the second resonant frequency,
wherein the microwave driver is configurable to selectively increase or decrease the ZZ interaction strength, and
wherein the microwave driver is configurable to reduce spurious interactions between the first qubit and the second qubit by selectively decreasing the ZZ interaction strength, and
wherein the microwave driver is configurable to form a two-qubit gate by selectively increasing the ZZ interaction strength, and
wherein the microwave driver is configurable for selectively tuning to obtain a given leakage rate, or a given gate speed, or a balance between a leakage rate and a gate speed.