US 12,333,191 B2
Apparatus with calibration input mechanism and methods for operating the same
Kevin G. Werhane, Kuna, ID (US); Vijayakrishna J. Vankayala, Allen, TX (US); and Tyrel Z. Jensen, Meridian, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Nov. 17, 2023, as Appl. No. 18/513,438.
Claims priority of provisional application 63/439,524, filed on Jan. 17, 2023.
Prior Publication US 2024/0241671 A1, Jul. 18, 2024
Int. Cl. G06F 3/06 (2006.01)
CPC G06F 3/0659 (2013.01) [G06F 3/0604 (2013.01); G06F 3/0679 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A calibration system, comprising:
a tester configured to provide an external reference voltage for a command-address (CA) input buffer (IB) calibration process;
an input connector couplable to the tester and configured to convey at least the external reference voltage; and
a target memory device couplable to the tester through the input connector, the target memory device including:
a CA pad configured to receive (1) commands and addresses from a memory controller for memory operations during normal operation and (2) connect to the set of input connectors and receive the external reference voltage during the CA IB calibration process;
an IB connected to the CA pad and configured to identify the commands and the addresses during the normal operation according to a trim setting and an internal reference voltage, wherein the CA IB calibration process is for determining the trim setting for the IB; and
a calibration control logic coupled to the CA pad and the IB, the calibration control logic configured to (1) provide the external reference voltage to the IB and (2) isolate the IB from the internal reference voltage during the CA IB calibration process.