US 12,332,776 B2
Memory sub-system LUN bypassing
Meng Wei, Pudong New District (CN)
Assigned to Micron Technology, Inc., Boise, ID (US)
Appl. No. 18/036,781
Filed by Micron Technology, Inc., Boise, ID (US)
PCT Filed Sep. 1, 2022, PCT No. PCT/CN2022/116454
§ 371(c)(1), (2) Date May 12, 2023,
PCT Pub. No. WO2024/045113, PCT Pub. Date Mar. 7, 2024.
Prior Publication US 2024/0345946 A1, Oct. 17, 2024
Int. Cl. G06F 12/02 (2006.01); G06F 3/06 (2006.01)
CPC G06F 12/0246 (2013.01) [G06F 3/0616 (2013.01); G06F 3/0644 (2013.01); G06F 3/0688 (2013.01); G06F 2212/7201 (2013.01)] 17 Claims
OG exemplary drawing
 
1. A method, comprising:
assigning a respective initial credit value to each LUN of a block stripe;
performing an erase operation across the block stripe;
reducing, in response to the erase operation, each respective initial credit value by a unit increment to provide a respective reduced credit value;
refraining from programming to each LUN of the block stripe having a respective reduced credit value equal to zero;
programming to each LUN of the block stripe having a respective reduced credit value greater than zero,
determining that each respective reduced credit value is equal to zero; and
reassigning the respective initial credit value to each LUN of the block stripe where each respective reduced credit value is equal to zero.