US 12,332,303 B2
Built-in self test with current measurement for analog circuit verification
Francois Laulanet, Brussels (BE); and Jorg Jos Daniels, Outgaarden (BE)
Assigned to SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed by SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC, Scottsdale, AZ (US)
Filed on Sep. 15, 2023, as Appl. No. 18/468,456.
Prior Publication US 2025/0093409 A1, Mar. 20, 2025
Int. Cl. G01R 31/3187 (2006.01); G01R 31/28 (2006.01)
CPC G01R 31/2884 (2013.01) [G01R 31/2894 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An integrated circuit device that comprises:
an analog circuit block configured to be powered by a current flow between a first power rail and an intermediate node;
a current sensor configured to provide digital measurements of the current flow; and
a built-in self test circuit configured to set the analog circuit block in an operating mode from a sequence of operating modes and coupled to the current sensor to capture for each operating mode in the sequence a corresponding one of the digital measurements.