US 12,332,300 B2
Testing device and testing method thereof
Kuan-Cheng Chang, Taichung (TW)
Assigned to Winbond Electronics Corp., Taichung (TW)
Filed by Winbond Electronics Corp., Taichung (TW)
Filed on May 15, 2023, as Appl. No. 18/317,100.
Claims priority of application No. 112109018 (TW), filed on Mar. 10, 2023.
Prior Publication US 2024/0302428 A1, Sep. 12, 2024
Int. Cl. G01R 31/28 (2006.01); G01R 31/319 (2006.01)
CPC G01R 31/2841 (2013.01) [G01R 31/2874 (2013.01); G01R 31/31905 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A testing device, comprising:
a controller, connected to a plurality of application platforms through an input interface, and the controller receiving a plurality of command sequences respectively sent by each of the application platforms through the input interface; and
a data storage device, storing a plurality of circuit information corresponding to each of the application platforms and each of the command sequences corresponding to each of the application platforms,
wherein, the controller is connected to at least one device under test through an output interface during a test period, and the controller executes a test operation on the at least one device under test according to each of the circuit information corresponding to each of the application platforms and each of the command sequences corresponding to each of the application platforms.