US 12,332,260 B2
Automatic analyzer
Yuichi Iwase, Tokyo (JP); Kohei Nonaka, Tokyo (JP); and Tetsuji Kawahara, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/276,941
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Oct. 18, 2019, PCT No. PCT/JP2019/041028
§ 371(c)(1), (2) Date Mar. 17, 2021,
PCT Pub. No. WO2020/090508, PCT Pub. Date May 7, 2020.
Claims priority of application No. 2018-204879 (JP), filed on Oct. 31, 2018.
Prior Publication US 2022/0034918 A1, Feb. 3, 2022
Int. Cl. G01N 35/00 (2006.01); G01N 35/10 (2006.01)
CPC G01N 35/0092 (2013.01) [G01N 35/1004 (2013.01); G01N 35/1009 (2013.01)] 7 Claims
OG exemplary drawing
 
1. An automatic analyzer, comprising:
a sample dispensing system including a sample probe configured to dispense a sample located in a sample dispensing position;
an apparatus controller configured to control the sample dispensing system;
a pump coupled to the apparatus controller;
a solenoid valve coupled to the apparatus controller; and
a syringe coupled to the apparatus controller,
wherein the sample probe is connected to the syringe through piping which is filled with a liquid,
wherein the apparatus controller is configured to:
execute interior cleaning performed on the sample probe by opening the solenoid valve and injecting the liquid into the piping by controlling the pump,
execute a first operation sequence to operate the sample dispensing system in a standby state continued until the sample is transported to the sample dispensing position, and
execute a second operation sequence to operate the sample dispensing system in an analysis state in which the sample located in the sample dispensing position is dispensed, and
wherein a time period during interior cleaning performed on the sample probe in a single cycle of the first operation sequence is set to be shorter than a time period during interior cleaning performed on the sample probe in a single cycle of the second operation sequence.