US 12,332,200 B2
Apparatus and method with electrode-based measurement
Hyeokki Hong, Suwon-si (KR); Chisung Bae, Suwon-si (KR); and Kitae Park, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Feb. 28, 2023, as Appl. No. 18/176,183.
Claims priority of application No. 10-2022-0111531 (KR), filed on Sep. 2, 2022.
Prior Publication US 2024/0077440 A1, Mar. 7, 2024
Int. Cl. G01N 27/00 (2006.01); G01N 33/483 (2006.01); G06F 11/16 (2006.01)
CPC G01N 27/00 (2013.01) [G01N 33/4836 (2013.01); G06F 11/1675 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
an electrode array configured to measure input signals of an analog domain through electrodes arranged in a target point;
main signal processors configured to perform signal processing operations on corresponding respective input signals of the input signals;
auxiliary signal processors configured to replace at least one of the main signal processors, and perform at least some of the signal processing operations in response to a replacement condition being satisfied, and
a controller configured to, when a plurality of replacement targets satisfying the replacement condition is detected from the main signal processors, determine a replacement priority of the replacement targets based on a defect level of the replacement targets.