| CPC G01N 23/207 (2013.01) [G01N 23/20008 (2013.01); G01N 2223/1016 (2013.01)] | 20 Claims |
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1. A diffractometer comprising:
an X-ray beam projector positioned and aligned to direct an X-ray beam at a target to be examined,
an X-ray receiver comprising an X-ray detector array positioned to detect the X-ray beam passed through the target and detect at least a portion of X-rays that the target diffracts; and
a computer workstation;
wherein the X-ray beam projector comprises a radiation source operating in continuous mode, an apparatus forming X-ray micro-beam and comprising at least one monochromator and at least one collimating and focusing optical device;
wherein the computer workstation is intended for controlling the X-ray beam projector, the X-ray receiver, and mechanisms and motors, and for processing, storing and displaying data received from 3-D diffractometric structural analysis, and also for calculation of parameters of a three-dimensional reciprocal lattice of the target to be examined,
wherein the receiver comprises a mechanism for moving the an X-ray detector array along the direction of the X-ray micro-beam that provides approximately the same resolution of diffraction measurements at small (less than 1 degree) and large (approximately about 90 degrees) angles of diffraction angles and one or more devices designed for excitation of transverse vibrations of a two-dimensional pixel detector in relation to the incident X-ray beam, and
wherein an amplitude of the transverse vibrations of the two-dimensional pixel detector is at least not less than a pixel's pitch.
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