US 12,332,183 B2
Method for detecting product for defects, electronic device, and storage medium
Chung-Yu Wu, New Taipei (TW); and Chin-Pin Kuo, New Taipei (TW)
Assigned to HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed by HON HAI PRECISION INDUSTRY CO., LTD., New Taipei (TW)
Filed on Mar. 27, 2023, as Appl. No. 18/126,804.
Claims priority of application No. 202210570241.4 (CN), filed on May 24, 2022.
Prior Publication US 2023/0384235 A1, Nov. 30, 2023
Int. Cl. G01N 21/88 (2006.01); G06N 3/0455 (2023.01)
CPC G01N 21/8851 (2013.01) [G06N 3/0455 (2023.01); G01N 2021/8887 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An electronic device comprising:
at least one processor; and
a storage device coupled to the at least one processor and storing instructions for execution by the at least one processor to cause the at least one processor to:
obtain an image of a product to be detected;
obtain a reconstructed image by inputting the image into a pre-trained autoencoder;
generate a difference image according to the image and the reconstructed image;
obtain a plurality of feature absolute values by performing clustering processing on the difference image;
generate a target image according to the plurality of feature absolute values, the difference image, and a preset value, the present value being a preset pixel value that is set according to a range of a plurality of absolute pixel values of the difference image; and
determine a defect detection result of the image by detecting the target image for defects.