US 12,010,901 B2
Display apparatus
Jinho Kim, Yongin-si (KR); Namhyoung Kim, Yongin-si (KR); and Jiyong Jung, Yongin-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
Filed on May 1, 2023, as Appl. No. 18/310,404.
Claims priority of application No. 10-2022-0109267 (KR), filed on Aug. 30, 2022.
Prior Publication US 2024/0074298 A1, Feb. 29, 2024
Int. Cl. G09G 3/3233 (2016.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01); G09G 3/00 (2006.01); H10K 59/131 (2023.01); H10K 59/40 (2023.01); H10K 59/88 (2023.01)
CPC H10K 59/88 (2023.02) [G06F 3/0412 (2013.01); G06F 3/04164 (2019.05); G06F 3/0446 (2019.05); G09G 3/006 (2013.01); G09G 3/3233 (2013.01); H10K 59/131 (2023.02); H10K 59/40 (2023.02); G09G 2300/0819 (2013.01); G09G 2300/0842 (2013.01); G09G 2300/0861 (2013.01); G09G 2330/12 (2013.01); G09G 2354/00 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A display apparatus comprising:
a substrate including a display area and a peripheral area surrounding at least a portion of the display area;
a plurality of pixel circuits in the display area;
a plurality of data lines in the display area, extending in a first direction, and electrically connected to the plurality of pixel circuits;
a plurality of first circuit driving signal lines in the peripheral area, and configured to transmit a first circuit driving signal to drive the plurality of pixel circuits;
a data test pad portion at one side of the peripheral area, and including a plurality of data test pads electrically connected to the plurality of data lines, respectively;
a pad portion at the one side of the peripheral area, and including a plurality of first circuit pads electrically connected to the plurality of first circuit driving signal lines, respectively;
a first test pad portion at the one side of the peripheral area, and including a plurality of first circuit test pads electrically connected to the plurality of first circuit pads, respectively; and
a second test pad portion at the one side of the peripheral area, and including a plurality of second circuit test pads electrically connected to the plurality of first circuit test pads, respectively.