CPC H04N 23/695 (2023.01) [G06T 7/215 (2017.01); G06T 7/337 (2017.01); G06T 2207/10061 (2013.01)] | 20 Claims |
1. A control system configured for tracking a sample under observation during an experimental session in an electron microscope, the control system comprising:
a memory; and
a processor;
wherein the processor of the control system is configured for:
tracking movement of the sample under observation as the sample changes during the experimental session,
wherein the movement of the sample is tracked within a region of interest positioned within a field of view of the electron microscope,
wherein the movement of the sample is tracked by comparing a live image of the sample against a template image of the region of interest;
determining a drift vector of the sample based on the tracked movement, wherein the drift vector includes an X-direction component and a Y-direction component;
adjusting the region of interest to correct for drift of the sample during the experimental session using the determined drift vector; and
morphing the template image to approximate the live image of the sample under observation using image filters.
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