US 12,007,758 B2
Process state monitoring device and process state monitoring method
Takehide Hirata, Tokyo (JP); Tatsuhiro Sue, Tokyo (JP); Masafumi Matsushita, Tokyo (JP); and Yohei Harada, Tokyo (JP)
Assigned to JFE STEEL CORPORATION, Tokyo (JP)
Appl. No. 17/440,267
Filed by JFE STEEL CORPORATION, Tokyo (JP)
PCT Filed Mar. 24, 2020, PCT No. PCT/JP2020/012821
§ 371(c)(1), (2) Date Sep. 17, 2021,
PCT Pub. No. WO2020/196441, PCT Pub. Date Oct. 1, 2020.
Claims priority of application No. 2019-057695 (JP), filed on Mar. 26, 2019.
Prior Publication US 2022/0187809 A1, Jun. 16, 2022
Int. Cl. G05B 19/418 (2006.01); G06F 3/14 (2006.01)
CPC G05B 19/41875 (2013.01) [G06F 3/14 (2013.01)] 10 Claims
OG exemplary drawing
 
1. A process state monitoring device comprising a processor comprising hardware, the processor being configured to:
separate two or more components from time series data of a value indicating a state of a process;
compute a characteristic value from each of the separated components;
classify the state of the process on the basis of the computed characteristic values;
search a past database for an operation case similar to the process on the basis of the computed characteristic values;
determine a similarity of the computed characteristic values and characteristic values of the operation case on the basis of a distance or an angle, in a variable space composed of a plurality of characteristic values, depending on the number of characteristic values to be compared; and
compute, as a contribution, the component contributing to the similarity.