US 12,007,432 B2
Enhanced direct current (DC) built-in-self-test (BIST) coverage for optical engines and advanced packaging
Sanjay Sunder, Allentown, PA (US); and Alexander C. Kurylak, Bethlehem, PA (US)
Assigned to Cisco Technology, Inc., San Jose, CA (US)
Filed by Cisco Technology, Inc., San Jose, CA (US)
Filed on Jul. 18, 2022, as Appl. No. 17/813,203.
Prior Publication US 2024/0019485 A1, Jan. 18, 2024
Int. Cl. G01R 31/28 (2006.01)
CPC G01R 31/2853 (2013.01) [G01R 31/2856 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for testing connectivity between a first integrated circuit (IC) and a second IC of an electronics package, the method comprising:
determining a measure of connectivity between the first IC and a photodiode in the second IC when a bias direction of the photodiode is forward biased, wherein determining the measure of connectivity comprises measuring a current flow through the photodiode when the bias direction of the photodiode is forward biased; and
determining whether there is a fault with at least one of the first IC or the second IC based on the measured current flow.