US 12,007,412 B2
Differential measurement probe
Benedikt Lippert, Munich (DE); Alexander Kunze, Munich (DE); and Alexander Stuka, Hengersberg (DE)
Assigned to ROHDE & SCHWARZ GMBH & CO. KG, Munich (DE)
Filed by ROHDE & SCHWARZ GMBH & CO. KG, Munich (DE)
Filed on Apr. 26, 2022, as Appl. No. 17/729,378.
Prior Publication US 2023/0341437 A1, Oct. 26, 2023
Int. Cl. G01R 1/073 (2006.01); G01R 1/067 (2006.01)
CPC G01R 1/07307 (2013.01) [G01R 1/06788 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A differential measurement probe comprising:
a first support plate;
a second support plate arranged in parallel to the first support plate;
a first printed circuit probe tip that comprises a first contact section for contacting a device under test; and
a second printed circuit probe tip that comprises a second contact section for contacting a device under test;
wherein the first printed circuit probe tip and the second printed circuit probe tip are arranged between the first support plate and the second support plate and are mechanically supported by the first support plate and the second support plate;
wherein the first printed circuit probe tip and the second printed circuit probe tip each comprise a multi-layer printed circuit board with an inner conductor layer, an outer conductor layer on one side of the inner conductor layer, and another outer conductor layer on the other side of the inner conductor layer.