US 12,007,405 B2
Material analysis method and material analysis apparatus
Kosuke Minami, Ibaraki (JP); Genki Yoshikawa, Ibaraki (JP); Gaku Imamura, Ibaraki (JP); and Kota Shiba, Ibaraki (JP)
Assigned to NATIONAL INSTITUTE FOR MATERIALS SCIENCE, Ibaraki (JP)
Appl. No. 17/055,687
Filed by NATIONAL INSTITUTE FOR MATERIALS SCIENCE, Ibaraki (JP)
PCT Filed Jun. 4, 2019, PCT No. PCT/JP2019/022080
§ 371(c)(1), (2) Date Nov. 16, 2020,
PCT Pub. No. WO2019/239950, PCT Pub. Date Dec. 19, 2019.
Claims priority of application No. 2018-111344 (JP), filed on Jun. 11, 2018.
Prior Publication US 2021/0190655 A1, Jun. 24, 2021
Int. Cl. G01N 5/02 (2006.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01)
CPC G01N 5/02 (2013.01) [G06N 5/04 (2013.01); G06N 20/00 (2019.01)] 13 Claims
OG exemplary drawing
 
1. A material analysis method for analyzing a material supported on a chemical sensor, the method comprising:
providing a chemical sensor with a material to be measured supported thereon, wherein the material to be measured coats a sensor body of the chemical sensor to form a receptor layer,
supplying at least one probe fluid to the chemical sensor having the receptor layer, and
analyzing the material to be measured based on a signal output from the chemical sensor based on a change in a physical parameter induced by an interaction between the at least one probe fluid and the material to be measured in the receptor layer, the interaction being induced by sorption or adsorption of the at least one probe fluid to the material to be measured supported on the chemical sensor by the supplying of the at least one probe fluid,
wherein the analysis is at least one selected from the group consisting of to distinguish whether or not the material to be measured is the same as another material; to identify the material to be measured; and to determine a quantity of a desired component in the material to be measured.