US 12,007,340 B2
X-ray CT apparatus
Takashi Nakayama, Kyoto (JP); and Atsuhiro Hayashi, Kyoto (JP)
Assigned to SHIMADZU Techno-Research, Inc., Kyoto (JP)
Appl. No. 17/624,554
Filed by SHIMADZU Techno-Research, Inc., Kyoto (JP)
PCT Filed Apr. 8, 2020, PCT No. PCT/JP2020/015783
§ 371(c)(1), (2) Date Jan. 3, 2022,
PCT Pub. No. WO2021/014696, PCT Pub. Date Jan. 28, 2021.
Claims priority of application No. 2019-136652 (JP), filed on Jul. 25, 2019.
Prior Publication US 2022/0252528 A1, Aug. 11, 2022
Int. Cl. G01N 23/046 (2018.01); A61B 6/00 (2006.01); G01N 3/20 (2006.01)
CPC G01N 23/046 (2013.01) [A61B 6/54 (2013.01); G01N 3/20 (2013.01)] 3 Claims
OG exemplary drawing
 
1. An X-ray CT apparatus including
an X-ray imaging system including an X-ray irradiation unit and an X-ray detector,
a stage disposed between the X-ray irradiation unit and the X-ray detector,
a rotation mechanism configured to relatively rotate the X-ray imaging system and the stage about a rotation axis orthogonal to an optical axis of an X-ray that runs from the X-ray irradiation unit to the X-ray detector, and
a load mechanism which is set on the stage and is configured to apply test force to a test piece,
the X-ray CT apparatus comprising:
an angle changing mechanism configured to tilt the load mechanism to change a direction of the test force applied to the test piece by the load mechanism from a direction orthogonal to the optical axis of the X-ray;
a camera configured to take a picture of the test piece; and
a connection member connecting the load mechanism to the camera so that the camera tilts together with the load mechanism.