US 12,007,226 B2
Measurement of thickness of scale or corrosion
Jill F. Geddes, Cambridge (GB); Trevor Lloyd Hughes, Cambridge (GB); Evgeny Borisovich Barmatov, Cambridge (GB); Man Yi Ho, Cambridge (GB); and Paul Barnes, Aberdeen (GB)
Assigned to SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US)
Appl. No. 17/757,096
Filed by Schlumberger Technology Corporation, Sugar Land, TX (US)
PCT Filed Dec. 8, 2020, PCT No. PCT/US2020/063730
§ 371(c)(1), (2) Date Jun. 9, 2022,
PCT Pub. No. WO2021/118966, PCT Pub. Date Jun. 17, 2021.
Claims priority of provisional application 62/947,845, filed on Dec. 13, 2019.
Prior Publication US 2023/0003517 A1, Jan. 5, 2023
Int. Cl. G01B 15/02 (2006.01); G01N 17/00 (2006.01)
CPC G01B 15/02 (2013.01) [G01N 17/006 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method for measuring a thickness of a deposit layer on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer, wherein the deposit layer includes scale deposits, corrosion products, or both, the method comprising:
measuring an elemental composition of at least one of the deposit layer, the metal substrate, or the alloy substrate using the XRF spectrometer; and
obtaining the thickness of the deposit layer from the elemental composition using a calibration relationship between deposit layer thicknesses and corresponding elemental compositions of the at least one of the deposit layer, the metal substrate, or the alloy substrate, wherein the calibration relationship is a relationship between deposit layer thicknesses measured by scanning electron microscopy (SEM) and corresponding elemental compositions of the at least one of the deposit layer, the metal substrate, or the alloy substrate measured by the XRF spectrometer.