US 12,328,806 B2
Light source system and method of operation
David Douglas, Palo Alto, CA (US); Robert Legg, Palo Alto, CA (US); Christopher Mayes, Palo Alto, CA (US); Bruce Dunham, Palo Alto, CA (US); Joseph Conway, Palo Alto, CA (US); George Randall Neil, Palo Alto, CA (US); Christopher Pierce, Palo Alto, CA (US); and Colwyn Gulliford, Palo Alto, CA (US)
Assigned to xLight Inc., Palo Alto, CA (US)
Filed by xLight Inc., Palo Alto, CA (US)
Filed on Nov. 25, 2024, as Appl. No. 18/959,313.
Application 18/959,313 is a continuation of application No. 18/794,414, filed on Aug. 5, 2024.
Claims priority of provisional application 63/531,967, filed on Aug. 10, 2023.
Prior Publication US 2025/0098056 A1, Mar. 20, 2025
Int. Cl. H05G 2/00 (2006.01); H01S 3/09 (2006.01)
CPC H05G 2/007 (2024.08) [H01S 3/0903 (2013.01); H05G 2/0084 (2024.08); H05G 2/0086 (2024.08)] 20 Claims
OG exemplary drawing
 
1. Alight source system comprising:
a first kicker configured to:
receive an input electron beam comprising a plurality of electron bunches; and
deflect electron bunches of the electron beam substantially within a first plane, thereby spatially separating the input electron beam into a first plurality of electron beams;
a second kicker configured to:
receive the first plurality of electron beams; and
deflect electron bunches of the first plurality of electron beams substantially within a second plane, thereby spatially separating the first plurality of electron beams into a second plurality of electron beams;
a first septum configured to:
receive a first subset of the second plurality of electron beams; and
deflect electron beams of the first subset substantially within the first plane; and
a second septum configured to:
receive a second subset of the second plurality of electron beams; and
deflect electron beams of the second subset substantially within the second plane.