| CPC H04N 17/002 (2013.01) [G01R 1/07307 (2013.01); G01R 31/2889 (2013.01); H04N 25/76 (2023.01); H01R 13/24 (2013.01)] | 18 Claims |
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1. A testing system for testing an image sensor, the testing system comprising:
a light source configured to deliver an input light to a device under test;
a probe card configured to contact pads of the device under test;
a pogo block configured to receive output image signals of the probe card;
an interface board configured to receive output image signals of the pogo block, to convert the received output image signals of the pogo block, and to output the converted signals through a cable; and
a testing apparatus connected to the interface board through the cable, and configured to test the device undertest based on signals received through the cable,
wherein the interface board includes an active interface module having a signal compensation circuit configured to amplify the received output signals of the pogo block, a signal generation circuit configured to convert the amplified signals into the converted signals such that the converted signals have a same frequency as the received output signals of the pogo block, transmit the converted signals to the cable, and generate a signal indicating a pass or a failure of a test based on a determination of whether the device under test passes or fails the test.
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