US 12,328,140 B2
Measurement apparatus and method for nonlinear damages in optical link
Yangyang Fan, Beijing (CN); and Zhenning Tao, Beijing (CN)
Assigned to Fujitsu Limited, Kawasaki (JP)
Filed by Fujitsu Limited, Kawasaki (JP)
Filed on Mar. 10, 2023, as Appl. No. 18/181,937.
Claims priority of application No. 202210294309.0 (CN), filed on Mar. 24, 2022.
Prior Publication US 2023/0327759 A1, Oct. 12, 2023
Int. Cl. H04B 10/079 (2013.01); G01M 11/00 (2006.01)
CPC H04B 10/07953 (2013.01) [G01M 11/333 (2013.01); H04B 10/07955 (2013.01)] 10 Claims
OG exemplary drawing
 
1. An apparatus to measure nonlinear damages in an optical link, comprising:
a memory; and
a processor coupled to the memory and to control execution of a process to,
generate respective multiple band-notch signals with different band-notch widths corresponding to a frequency point to be measured;
calculate respective multiple nonlinear noise-to-power ratios at the frequency point to be measured, according to the respective multiple band-notch signals obtained after the respective multiple band-notch signals with different band-notch widths pass through the optical link; and
extrapolate a real nonlinear noise-to-power ratio at the frequency point to be measured, according to the respective multiple nonlinear noise-to-power ratios corresponding to the respective multiple band-notch signals with different band-notch widths.