US 12,328,125 B2
Device, method and system to determine calibration information with a shared ring oscillator circuit
Chee Seng Leong, Gelugor (MY)
Assigned to Altera Corporation, San Jose, CA (US)
Filed by Altera Corporation, San Jose, CA (US)
Filed on Sep. 22, 2021, as Appl. No. 17/482,119.
Prior Publication US 2023/0088853 A1, Mar. 23, 2023
Int. Cl. H03L 1/00 (2006.01); H03K 3/011 (2006.01); H03K 3/03 (2006.01); H03K 19/0185 (2006.01); H03L 7/00 (2006.01)
CPC H03L 1/00 (2013.01) [H03K 3/011 (2013.01); H03K 3/0315 (2013.01); H03K 3/0322 (2013.01); H03K 19/018528 (2013.01); H03L 7/00 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A first integrated circuit (IC) die comprising:
a hardware interface comprising conductive contacts to couple the first IC die to a second IC die;
first transmit driver circuits to communicate with the second IC die via the hardware interface;
first delay circuits coupled to the hardware interface to be coupled with second delay circuits of the second IC die to form a shared oscillator circuit that includes the first and second delay circuits; and
calibration circuitry coupled to the first transmit driver circuits and to the first delay circuits to:
identify a shared oscillator setting that enables the shared oscillator circuit to satisfy a reference frequency test condition, and
provide a driver setting, based on the shared oscillator setting, to the first transmit driver circuits.