US 12,327,872 B2
All-solid battery including line-shaped structural defect in solid electrolyte layer or current collector
Eiichi Koga, Osaka (JP)
Assigned to Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed by Panasonic Intellectual Property Management Co., Ltd., Osaka (JP)
Filed on Mar. 1, 2022, as Appl. No. 17/683,402.
Application 17/683,402 is a continuation of application No. PCT/JP2020/006322, filed on Feb. 18, 2020.
Claims priority of application No. 2019-168658 (JP), filed on Sep. 17, 2019.
Prior Publication US 2022/0190349 A1, Jun. 16, 2022
Int. Cl. H01M 4/70 (2006.01); H01M 4/13 (2010.01); H01M 10/0525 (2010.01); H01M 10/0585 (2010.01)
CPC H01M 4/70 (2013.01) [H01M 4/13 (2013.01); H01M 10/0525 (2013.01); H01M 10/0585 (2013.01); H01M 2300/0065 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A battery comprising:
an electrode layer;
a counter electrode layer disposed to face the electrode layer; and
a solid electrolyte layer located between the electrode layer and the counter electrode layer, wherein;
the electrode layer includes:
a current collector; and
an active material layer located between the current collector and the solid electrolyte layer and having an area smaller than areas of the current collector and the solid electrolyte layer in plan view,
in the plan view, when a region where the active material layer is located is designated as a first region and a region outside the first region is designated as a second region,
the solid electrolyte layer covers an outside of the active material layer in the plan view and is in contact with the current collector in the second region, and
the current collector includes at least one structural defect portion having a line shape in the plan view located only in the second region,
the current collector includes:
a current collector layer in contact with the active material layer; and
a substrate in contact with a surface of the current collector layer opposite to a surface facing the active material layer, and
the at least one structural defect portion is formed in the substrate.