| CPC H01L 22/20 (2013.01) [H01L 21/67109 (2013.01); H01L 21/67276 (2013.01); H01L 21/67766 (2013.01); H01L 22/10 (2013.01); Y02P 90/30 (2015.11)] | 9 Claims |

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1. A method for managing chip manufacturing equipment, the method comprising:
determining, for each furnace tube device in a target area, a processing precision of the furnace tube device, through a heating uniformity result obtained by testing the furnace tube device, a processing test result of a test piece after processed by the furnace tube device, and factory parameters of the furnace tube device;
marking a processing precision label for each furnace tube device according to a processing precision of each furnace tube device;
determining, when it is detected that a first rule is set in a first furnace tube device, at least one second furnace tube device having device capability same as the first furnace tube device in the target area, wherein the first rule comprises: product categories that are allowed to be processed by the furnace tube device, and a processing precision label required for processing each of the product categories;
determining, from the at least one second furnace tube device, a target second furnace tube device having a processing precision label same as that required by the first rule;
determining a priority synchronization sequence of the target second furnace tube device according to a processing precision of each target second furnace tube device; and
synchronizing the first rule in the first furnace tube device to the target second furnace tube device according to the priority synchronization sequence.
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