US 12,326,791 B2
Test circuit, method, and apparatus for to-be-tested module
Jing Li, Zhejiang (CN); Yi Zhou, Zhejiang (CN); Luyang Zhang, Zhejiang (CN); and Wenxing Li, Zhejiang (CN)
Assigned to Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd., ZheJiang (CN)
Appl. No. 17/907,666
Filed by Horizon Journey (Hangzhou) Artificial Intelligence Technology Co., Ltd., Zhejiang (CN)
PCT Filed Mar. 30, 2022, PCT No. PCT/US2022/084160
§ 371(c)(1), (2) Date Sep. 28, 2022,
PCT Pub. No. WO2022/228014, PCT Pub. Date Nov. 3, 2022.
Claims priority of application No. 202110487704.6 (CN), filed on Apr. 30, 2021.
Prior Publication US 2024/0211361 A1, Jun. 27, 2024
Int. Cl. G06F 11/00 (2006.01); G06F 11/26 (2006.01); G06F 11/263 (2006.01); G06F 11/273 (2006.01)
CPC G06F 11/261 (2013.01) [G06F 11/263 (2013.01); G06F 11/2733 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A test circuit for a module to be tested, comprising a test data generation module and a functional safety module, wherein
the test data generation module comprises a plurality of test data generation units, and each test data generation unit is respectively electrically connected to the functional safety module;
each test data generation unit is configured to generate test data consistent with a data type supported by the test data generation unit based on raw data consistent with the data type;
the functional safety module is electrically connected to the module to be tested, and is configured to perform check operation processing on the test data to obtain a first processing result, and to perform check operation processing and fault injection processing on the test data to obtain a second processing result; and
the module to be tested is configured to perform check operation processing on the test data to obtain a check operation result; generate a test result based on the check operation result, the first processing result, and the second processing result, wherein in a case where the check operation result and the first processing result are the same and the check operation result and the second processing result are different, the test result indicates the module to be tested passes a test.