US 12,326,709 B2
Method and device for testing product, computer device and readable storage medium
Liang Feng, Jiangsu (CN)
Assigned to Saimeite Technology Co., Ltd., Jiangsu (CN)
Filed by Saimeite Technology Co., Ltd., Jiangsu (CN)
Filed on Sep. 13, 2022, as Appl. No. 17/943,905.
Claims priority of application No. 202210010175.5 (CN), filed on Jan. 6, 2022.
Prior Publication US 2023/0213911 A1, Jul. 6, 2023
Int. Cl. G05B 19/406 (2006.01)
CPC G05B 19/406 (2013.01) [G05B 2219/31316 (2013.01)] 9 Claims
OG exemplary drawing
 
1. A method for testing a product, applicable to a semiconductor processing system, wherein the semiconductor processing system comprises one testing machine and at least one processing machine, wherein the testing machine is connected with the at least one processing machine through a communication interface, and products of a same testing cycle are sequentially transferred to individual processing machines for being processed, and processed products are sequentially transferred to the testing machine for being tested, and during the testing machine tests the products, the method comprises:
counting, for each processing machine, a total product number and a tested-product number of processed products processed by the processing machine during a first testing stage of the testing cycle, wherein the total product number is number of all of products which have been processed by the processing machine and then transferred to the testing machine, and the tested-product number is number of products in processed products that meet a preset sampling rule;
calculating a product testing rate of each processing machine, for each processing machine, according to the total product number of the processing machine and the tested-product number of the processing machine;
transferring sequentially products in unprocessed products that meet the preset sampling rule to a processing machine whose product testing rate is lower than a preset threshold for being processed, when at least one machine with a product testing rate lower than the preset threshold and at least one machine with a product testing rate higher than the preset threshold appear in the first testing stage, during a second testing stage of the testing cycle, and sequentially transferring products in the unprocessed products that do not meet the preset sampling rule to a processing machine whose product testing rate is higher than the preset threshold to be processed, and calculating a product testing rate of each machine in the second testing stage, wherein the unprocessed products are products that have not been processed by the processing machine in the testing cycle; and
transferring sequentially products in the unprocessed products that meet the preset sampling rule to a processing machine whose product testing rate is lower than the preset threshold for being processed, when at least one machine with a product testing rate lower than the preset threshold and at least one machine with a product testing rate higher than the preset threshold appear in the second testing stage, and sequentially transferring products in the unprocessed products that do not meet the preset sampling rule to a processing machine whose product testing rate is higher than the preset threshold to be processed, until end of current testing cycle.