	US 12,326,409 B2
	Sample component determination method, sample component determination apparatus, learning method and computer readable non-transitory recording medium
Akira Ogoshi, Kyoto (JP)
Assigned to SHIMADZU CORPORATION, Kyoto (JP)
Filed by Shimadzu Corporation, Kyoto (JP)
Filed on Aug. 28, 2020, as Appl. No. 17/006,333.
Claims priority of application No. 2019-201388 (JP), filed on Nov. 6, 2019.
Prior Publication US 2021/0131983 A1, May 6, 2021
Int. Cl. G01N 23/2209 (2018.01); G01N 23/2252 (2018.01); G06N 3/042 (2023.01); G06N 3/045 (2023.01); G06N 3/09 (2023.01); G06N 20/00 (2019.01)

CPC G01N 23/2209 (2018.02) [G01N 23/2252 (2013.01); G06N 3/042 (2023.01); G06N 3/045 (2023.01); G06N 3/09 (2023.01); G06N 20/00 (2019.01); G01N 2223/079 (2013.01); G01N 2223/305 (2013.01)]

19 Claims

1. A sample component determination method comprising:

irradiating a sample with a wavelength dispersive X-ray analyzer to measure a sample spectrum;

acquiring the sample spectrum measured by the wavelength dispersive X-ray analyzer;

defining a target element to be analyzed in the sample and an input wavelength range corresponding to the target element; and

extracting spectrum data from the sample spectrum within the input wavelength range to obtain a partial spectrum of the sample spectrum; and

determining a chemical bonding state of the target element in the sample by inputting a partial spectrum of the sample spectrum that falls within the input wavelength range to a first trained model that outputs probabilities indicating a correspondence between the sample and each compound of a plurality of chemical compounds containing the target element.