US 12,326,391 B2
Particle quantifying device
Satoshi Takahashi, Tokyo (JP)
Assigned to HITACHI HIGH-TECH CORPORATION, Tokyo (JP)
Appl. No. 17/628,440
Filed by Hitachi High-Tech Corporation, Tokyo (JP)
PCT Filed Mar. 17, 2020, PCT No. PCT/JP2020/011638
§ 371(c)(1), (2) Date Jan. 19, 2022,
PCT Pub. No. WO2021/019830, PCT Pub. Date Feb. 4, 2021.
Claims priority of application No. 2019-138526 (JP), filed on Jul. 29, 2019.
Prior Publication US 2022/0268689 A1, Aug. 25, 2022
Int. Cl. G01N 15/1433 (2024.01); G01N 15/10 (2024.01); G01N 15/14 (2024.01); G01N 15/1429 (2024.01); G01N 21/17 (2006.01); G01N 33/50 (2006.01)
CPC G01N 15/1433 (2024.01) [G01N 15/1429 (2013.01); G01N 33/50 (2013.01); G01N 2015/1006 (2013.01); G01N 2015/1486 (2013.01); G01N 2021/1765 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A particle quantifying device, comprising:
an imaging lens that acquires a sample image representing a particulate sample; and
a computer configured to process data that executes a computation process relating to the sample image, wherein
the computer configured to process data
acquires a frequency domain representation of a single sample image,
separates the frequency domain representation into a high-frequency component and a low-frequency component,
acquires a high-frequency image as a spatial domain representation of the high-frequency component,
acquires a low-frequency image as a spatial domain representation of the low-frequency component, and
recognizes the particulate sample based on the high-frequency image and the low-frequency image that are obtained from the single sample image.