| CPC G06F 21/55 (2013.01) [G06F 11/1004 (2013.01); G06F 30/333 (2020.01); G06F 7/584 (2013.01); G06F 2111/04 (2020.01); G06F 2221/034 (2013.01)] | 19 Claims |
|
1. A detecting method capable of detecting a modification in a semiconductor device, said method comprising:
first applying, by an algorithm executed in a computer simulation, an exhaustive first set of patterns to inputs of a model of an original semiconductor device, said exhaustive first set of patterns developed by a pseudorandom number generator initialized with seed values;
first producing, by said computer simulation, a first set of response patterns from outputs of said model;
first compressing, by a signature analyzer, said first set of response patterns to provide to a first cyclic redundancy code in relation to said first applying;
second applying, by by a hardware implementation of said algorithm and said pseudorandom number generator, an identical exhaustive set of patterns to inputs of a manufactured physical device of said design;
second producing, by said hardware implementation, a second set of response patterns from outputs of said physical device;
second compressing, by a signature analyzer in said hardware implementation, said response patterns to provide to a second cyclic redundancy check code in relation to said second applying;
comparing, by said hardware implementation, said second cyclic redundancy check code to said first cyclic redundancy check code to determine one of identity or non-identity of said second cyclic redundancy check code to said first cyclic redundancy check code; and
categorizing, by said hardware implementation, said physical device in relation to said comparing, said categorizing further comprising:
failing, if said comparing determines non-identity, of said physical device; and
passing, if said comparing determines identity, of said physical device.
|