US 12,001,358 B2
Status check using signaling from a memory device
Reshmi Basu, Boise, ID (US); and Jonathan S. Parry, Boise, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Feb. 27, 2023, as Appl. No. 18/114,617.
Application 18/114,617 is a continuation of application No. 17/105,053, filed on Nov. 25, 2020, granted, now 11,599,485.
Prior Publication US 2023/0281140 A1, Sep. 7, 2023
This patent is subject to a terminal disclaimer.
Int. Cl. G06F 13/16 (2006.01); G06F 1/12 (2006.01)
CPC G06F 13/1689 (2013.01) [G06F 1/12 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An apparatus, comprising:
a memory device comprising a plurality of memory dies, each memory die of the plurality of memory dies configured to output a ready signal that indicates whether a memory die is available to receive a command;
an output circuit coupled with each memory die of the plurality of memory dies and configured to receive a plurality of ready signals associated with the plurality of memory dies via a corresponding latch and generate an indicator corresponding to a selected memory die of the plurality of memory dies based at least in part on receiving the plurality of ready signals; and
a first pin coupled with the output circuit and configured to output the indicator to a controller over an input/output (I/O) channel.