US 12,001,192 B2
Device adjustment instrument, additive manufacturing device, additive manufacturing method, and program
Yukihiko Inoue, Tokyo (JP)
Assigned to MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo (JP)
Appl. No. 17/040,814
Filed by MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo (JP)
PCT Filed Mar. 28, 2019, PCT No. PCT/JP2019/013755
§ 371(c)(1), (2) Date Sep. 23, 2020,
PCT Pub. No. WO2019/189639, PCT Pub. Date Oct. 3, 2019.
Claims priority of application No. 2018-065070 (JP), filed on Mar. 29, 2018.
Prior Publication US 2021/0026332 A1, Jan. 28, 2021
Int. Cl. G05B 19/4099 (2006.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 10/60 (2021.01); B22F 10/85 (2021.01); B23K 26/342 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B33Y 80/00 (2015.01); G05B 19/4155 (2006.01); B22F 10/36 (2021.01); B23K 101/00 (2006.01)
CPC G05B 19/4099 (2013.01) [B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 10/60 (2021.01); B22F 10/85 (2021.01); B23K 26/342 (2015.10); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B33Y 80/00 (2014.12); G05B 19/4155 (2013.01); B22F 10/36 (2021.01); B22F 10/385 (2021.01); B23K 2101/001 (2018.08); B33Y 10/00 (2014.12); G05B 2219/45135 (2013.01); G05B 2219/49023 (2013.01)] 14 Claims
OG exemplary drawing
 
1. A device adjustment instrument that adjusts an operation condition of an additive manufacturing device for manufacturing an object, the device adjustment instrument comprising:
a non-transitory memory that stores standard test piece data corresponding to each of a plurality of standard test pieces manufacturable by the additive manufacturing device and a standard parameter set when the standard test piece is manufactured;
a processor that
selects, based on modeling specification data of the object, the standard test piece data conforming to the modeling specification data from a plurality of pieces of the standard test piece data,
generates a modeling parameter set for adjusting the operation condition of the additive manufacturing device based on the selected standard test piece data and test modeling result data of the standard test piece manufactured by the additive manufacturing device using the standard parameter set corresponding to the standard test piece data,
determines whether or not the object satisfies a predetermined quality condition based on modeling result data as a measurement result of the object manufactured by the additive manufacturing device using the modeling specification data and the modeling parameter set, and
stores the modeling specification data, the standard test piece data, the test modeling result data, the modeling parameter set, and the modeling result data in the past in a case where the object satisfies a predetermined quality condition in the non-transitory memory as the case data in association with one another,
wherein the non-transitory memory stores case data as a past operation result of the additive manufacturing device, and
wherein the processor generates the modeling parameter set for adjusting the operation condition of the additive manufacturing device based on the test modeling result data and the case data.