CPC G01R 3/00 (2013.01) [G01R 1/07307 (2013.01)] | 13 Claims |
1. An apparatus for an automated assembly of a probe head for testing electronic devices, the apparatus comprising:
a support configured to support at least two parallel guides, which are provided with a plurality of respective guide holes;
at least one holding means configured to hold a contact probe to be housed in the guide holes, wherein the support is a movable support configured to be moved according to a preset trajectory between a first position, wherein the contact probe is held at a predetermined position outside the guide holes by the holding means, and a second position wherein the contact probe, which is held at the predetermined position, is housed in a set of guide holes that are substantially concentric to each other;
actuators of the support; and
a central unit connected to the actuators, the preset trajectory being calculated in the central unit according to a profile of the contact probe, the central unit being adapted to transform the profile into control instructions which are sent to the actuators of the support.
|