US 12,000,800 B2
System and method for passive normalization of a probe
Fadl Abdellatif, Thuwal (SA); Hesham A. Jifri, Thuwal (SA); Sahejad Patel, Thuwal (SA); Ali Alrasheed, Thuwal (SA); Amjad Felemban, Thuwal (SA); and Jeff S. Shamma, Thuwal (SA)
Assigned to SAUDI ARABIAN OIL COMPANY, Dhahran (SA); and King Abdullah University of Science and Technology, Thuwal (SA)
Filed by Saudi Arabian Oil Company, Dhahran (SA); and KING ABDULLAH UNIVERSITY OF SCIENCE AND TECHNOLOGY, Thuwal (SA)
Filed on Apr. 12, 2023, as Appl. No. 18/299,292.
Application 18/299,292 is a continuation of application No. 17/107,829, filed on Nov. 30, 2020, granted, now 11,650,185.
Prior Publication US 2023/0243782 A1, Aug. 3, 2023
Int. Cl. G01N 29/24 (2006.01); G01N 29/22 (2006.01); G01N 29/265 (2006.01)
CPC G01N 29/2493 (2013.01) [G01N 29/225 (2013.01); G01N 29/265 (2013.01); G01N 2291/2626 (2013.01)] 13 Claims
OG exemplary drawing
 
1. An assembly configured to hold a probe adjacent to a test surface, comprising:
a first connector;
a first arm pivotably coupled to the first connector at a first end thereof, the first arm extending in a forward direction and extending in a normal direction perpendicular to the forward direction and normal to the test surface, the first arm configured to pivot with a first degree of freedom in the forward direction;
a second arm pivotably coupled to the first connector at a first end thereof, the second arm extending in a rearward direction opposite to the forward direction and extending in the normal direction, the second arm configured to pivot with the first degree of freedom in the rearward direction;
a pair of first mounting members each coupled to a respective second end of the first and second arms;
a pair of first wheels each coupled to a respective first mounting member; and
a holder monolithically integral with the first connector and configured to hold the probe,
wherein the pivotable coupling of the first and second arms to the first connector passively normalizes a detection direction of the probe as the probe traverses the test surface.