US 12,000,780 B2
Information processing system, information processing device, information processing method, and program
Atsushi Kanda, Chofu (JP); Yuji Satoh, Amagasaki (JP); Ippei Uchikata, Amagasaki (JP); and Tomotaka Yamamoto, Amagasaki (JP)
Assigned to JAPAN AEROSPACE EXPLORATION AGENCY, (JP); and MITSUBISHI ELECTRIC SOFTWARE CORPORATION, (JP)
Appl. No. 17/779,018
Filed by JAPAN AEROSPACE EXPLORATION AGENCY, Tokyo (JP); and MITSUBISHI ELECTRIC SOFTWARE CORPORATION, Tokyo (JP)
PCT Filed Nov. 25, 2020, PCT No. PCT/JP2020/043864
§ 371(c)(1), (2) Date May 23, 2022,
PCT Pub. No. WO2021/106945, PCT Pub. Date Jun. 3, 2021.
Claims priority of application No. 2019-215755 (JP), filed on Nov. 28, 2019.
Prior Publication US 2022/0412887 A1, Dec. 29, 2022
Int. Cl. G01N 21/47 (2006.01)
CPC G01N 21/4785 (2013.01) 13 Claims
OG exemplary drawing
 
1. An information processing system comprising:
an irradiation unit configured to irradiate a deposited material with electromagnetic waves;
a detection unit configured to detect scattered waves or transmitted waves of the electromagnetic waves with which the deposited material has been irradiated by the irradiation unit;
a determination unit configured to determine a state of the deposited material from an image based on the scattered waves or the transmitted waves detected by the detection unit; and
an extraction unit configured to extract a plurality of feature quantities from the image based on the scattered waves or the transmitted waves detected by the detection unit,
wherein the determination unit is configured to input the plurality of feature quantities extracted by the extraction unit to a model which is learned to output a state quantity of a material when a plurality of feature quantities acquired from an image based on scattered waves or transmitted waves of electromagnetic waves with which the material has been irradiated are input to the model and to determine the state of the deposited material on the basis of output results from the model to which the plurality of feature quantities are input.