US 12,000,694 B2
Computer-implemented method for automatically producing metrology test plan
Thomas Guth, Aalen (DE); Annett Froewis, Oberkochen (DE); Birgit Huber, Aalen (DE); Günter Haas, Aalen (DE); and Ana Carolina Mayr Adam, Aalen (DE)
Assigned to Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen (DE)
Filed by Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen (DE)
Filed on Mar. 15, 2021, as Appl. No. 17/201,912.
Claims priority of application No. 20163348 (EP), filed on Mar. 16, 2020.
Prior Publication US 2021/0285763 A1, Sep. 16, 2021
Int. Cl. G01B 21/20 (2006.01)
CPC G01B 21/20 (2013.01) 20 Claims
OG exemplary drawing
 
1. A computer-implemented method for automatically producing a test plan for measuring a measured object, the method comprising:
obtaining a desired dataset of the measured object;
providing a starting pattern that is independent of measurement data of the measured object, wherein:
the providing comprises producing a division,
the producing the division comprises applying at least one division function, and
the division has a plurality of division indices;
producing a target pattern by generating a comparison between the desired dataset and the division, wherein at least one division index is adapted in response to a deviation of the division from the desired dataset;
creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern; and
according to the test plan, controlling operation of a coordinate measuring machine to measure the measured object.