US 11,998,748 B2
Identification of compromised components in a medical system
Jonathon E. Giftakis, Maple Grove, MN (US); Timothy J. Denison, Minneapolis, MN (US); Paul H. Stypulkowski, North Oaks, MN (US); Scott R. Stanslaski, Shoreview, MN (US); Robert S. Raike, Minneapolis, MN (US); Mae Eng, Shoreview, MN (US); David E. Linde, Corcoran, MN (US); and Thomas Adamski, Andover, MN (US)
Assigned to MEDTRONIC, INC., Minneapolis, MN (US)
Filed by MEDTRONIC, INC., Minneapolis, MN (US)
Filed on Jun. 30, 2021, as Appl. No. 17/364,609.
Application 17/364,609 is a division of application No. 15/699,873, filed on Sep. 8, 2017, granted, now 11,077,305.
Claims priority of provisional application 62/393,268, filed on Sep. 12, 2016.
Prior Publication US 2021/0322770 A1, Oct. 21, 2021
Int. Cl. A61N 1/36 (2006.01); A61N 1/05 (2006.01); A61N 1/08 (2006.01)
CPC A61N 1/3614 (2017.08) [A61N 1/36142 (2013.01); A61N 1/0531 (2013.01); A61N 1/0534 (2013.01); A61N 2001/083 (2013.01); A61N 1/36082 (2013.01); A61N 1/36185 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A method of detecting a fault in an implantable medical device system, comprising:
sensing a first brain signal via an electrode at a first brain location of an anatomy of a patient;
associating a portion of the first brain signal with a second brain signal that is introduced at a second brain location of the anatomy of the patient; and
determining whether a fault exists in the system based on one or more characteristics of the associated portion of the first brain signal, wherein one or more of associating a portion of the first brain signal with the second brain signal and determining whether the fault exists in the system are performed by one or more processors.