US 12,323,573 B2
Image sensors for advanced driver assistance systems utilizing regulator voltage verification circuitry to detect malfunctions
Hong Chean Choo, Johor Bahru (MY); Lookah Chua, Singapore (SG); and Wai Yin Hnin, Singapore (SG)
Assigned to STMicroelectronics Asia Pacific Pte Ltd, Singapore (SG)
Filed by STMicroelectronics Asia Pacific Pte Ltd, Singapore (SG)
Filed on May 4, 2022, as Appl. No. 17/736,504.
Application 17/736,504 is a division of application No. 16/514,695, filed on Jul. 17, 2019, granted, now 11,356,654.
Claims priority of provisional application 62/713,175, filed on Aug. 1, 2018.
Prior Publication US 2022/0264082 A1, Aug. 18, 2022
Int. Cl. H04N 17/00 (2006.01); G01R 19/00 (2006.01); G01R 19/25 (2006.01); H04N 25/69 (2023.01); H04N 25/78 (2023.01); G08G 1/16 (2006.01)
CPC H04N 17/002 (2013.01) [G01R 19/0038 (2013.01); G01R 19/2506 (2013.01); H04N 25/69 (2023.01); H04N 25/78 (2023.01); G08G 1/16 (2013.01)] 13 Claims
OG exemplary drawing
 
1. A method for use with an array of image pixels including a plurality of rows with active imaging pixels and at least one row with regulator voltage verification circuits, wherein the plurality of rows with active imaging pixels and the at least one row with regulator voltage verification circuits operate based upon a regulated voltage, the method comprising testing the regulated voltage by:
activating the at least one row with regulator voltage verification circuits to operate in test mode;
generating a test black voltage and a test white voltage as a function of the regulated voltage;
alternatively passing the test black voltage and the test white voltage to a switching circuit as a test voltage;
passing the test voltage from the switching circuit to a comparison circuit that asserts a counter reset signal when the test voltage and an analog to digital conversion signal are equal in voltage; and
resetting and starting a counter at a beginning of each test cycle within the test mode, stopping the counter upon assertion of the counter reset signal, and outputting a count of the counter, the count being proportional to the test voltage when in the test mode.