US 12,323,194 B2
Measuring system and associated method
Ming-Chung Huang, Hsinchu (TW); and Hsiang-Chen Kuo, Hsinchu (TW)
Assigned to REALTEK SEMICONDUCTOR CORPORATION, Hsinchu (TW)
Filed by REALTEK SEMICONDUCTOR CORPORATION, Hsinchu (TW)
Filed on Dec. 5, 2022, as Appl. No. 18/061,808.
Claims priority of application No. 110146686 (TW), filed on Dec. 14, 2021.
Prior Publication US 2023/0188228 A1, Jun. 15, 2023
Int. Cl. H04B 17/29 (2015.01); H03F 3/24 (2006.01)
CPC H04B 17/29 (2015.01) [H03F 3/24 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A measuring system, configured to measure a phase of an IMD3 signal generated by a power amplifier, the system comprising:
a signal generator, coupled to an input terminal of the power amplifier;
a spectrum analyzer, coupled to an output terminal of the power amplifier; and
a controller, configured to perform phases estimation process, including a plurality of sub-processes, wherein each sub-process comprises:
controlling the signal generator to generate a first main signal, a second main signal, a first adjustable signal, wherein a frequency of each of the first main signal, the second main signal, the first adjustable signal is f1, f2, and 2f1-f2; and
controlling the spectrum analyzer to correspondingly measure a first power at the frequency of 2f1-f2;
wherein the power of the first adjustable signal in each sub-process is the same as that in any other sub-processes, but the phase of the first adjustable signal in each sub-process is different from that of any other sub-processes, the phase and power of the first main signal in each sub-process are the same as that in any other sub-processes, the phase and power of the second main signal in each sub-process are the same as that in any other sub-processes, and the controller estimates the phase of the IMD3 signal generated at the frequency of 2f1-f2 by the first main signal and the second main signal passing through the power amplifier based on a plurality of first powers obtained by the plurality of sub-processes.