| CPC H01L 24/80 (2013.01) [B23K 20/023 (2013.01); C04B 37/006 (2013.01); C04B 2237/124 (2013.01); C04B 2237/52 (2013.01); H01L 2224/80011 (2013.01); H01L 2224/80075 (2013.01); H01L 2224/80095 (2013.01); H01L 2224/80203 (2013.01); H01L 2224/80895 (2013.01)] | 11 Claims | 

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               1. A bonding method for a copper-copper metal, comprising the following steps: 
            providing copper-plated substrates; 
                subjecting copper-plated surfaces of clean copper-plated substrates to pretreatment with hydrazine hydrate under a protective atmosphere, to obtain copper-plated surfaces to be bonded, wherein the clean copper-plated substrates are kept at a temperature of 50° C. to 90° C. during the pretreatment; and 
                subjecting a plurality of the copper-plated substrates to be bonded to pressurized bonding at a temperature of 200° C. to 300° C. under the protective atmosphere, 
                wherein the copper-plated substrates are selected from the group consisting of copper-plated silicon and coper-plated silicon carbide. 
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