| CPC H01L 23/24 (2013.01) [H01L 21/481 (2013.01); H01L 21/4885 (2013.01); H01L 21/563 (2013.01); H01L 23/49816 (2013.01); H01L 23/49827 (2013.01); H01L 25/105 (2013.01); H05K 1/181 (2013.01); H01L 24/48 (2013.01); H01L 24/73 (2013.01); H01L 2224/16225 (2013.01); H01L 2224/26175 (2013.01); H01L 2224/32225 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48227 (2013.01); H01L 2224/73204 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/92125 (2013.01); H01L 2225/1023 (2013.01); H01L 2225/1058 (2013.01); H01L 2924/15311 (2013.01); H01L 2924/15331 (2013.01); H01L 2924/18161 (2013.01); H05K 2201/049 (2013.01); H05K 2201/10378 (2013.01); H05K 2201/10515 (2013.01); H05K 2201/10734 (2013.01); H05K 2201/2036 (2013.01); Y02P 70/50 (2015.11)] | 20 Claims |

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1. A structure comprising:
a substrate, the substrate comprising a die attach region, an underfill region, and a connect region, wherein the underfill region includes the die attach region and an area surrounding the die attach region, and wherein the connect region is disposed outside the underfill region, the substrate comprising a conductive feature;
a first contact pad and a second contact pad, wherein the first contact pad is disposed within the die attach region, wherein the second contact pad is disposed in the connect region;
a first dam over the substrate, the first dam comprising a first layer of conductive material directly contacting the conductive feature, wherein the first dam is disposed around the underfill region;
a die attached to the first contact pad of the die attach region by a first connector, wherein the first dam is isolated from circuitry of the die; and
a package device attached to the second contact pad by a second connector, the package device having a bottom surface that simultaneously contacts a top surface of the die and a top surface of the first dam.
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