| CPC H01L 23/10 (2013.01) [B81B 7/0032 (2013.01); B81B 7/0074 (2013.01); B81C 1/00261 (2013.01); B81C 1/00269 (2013.01); B81C 1/00333 (2013.01); H01L 23/02 (2013.01); H01L 23/04 (2013.01); H01L 23/053 (2013.01); B81C 2203/038 (2013.01)] | 14 Claims |

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1. A microelectronic assembly, comprising:
a first microelectronic component bonded at a first insulating surface to a second insulating surface of a second microelectronic component, the first insulating surface having a first conductive feature and the second insulating surface having a second conductive feature, the first insulating surface and the second insulating surface forming a bond joint where the first insulating surface and the second insulating surface make contact and the bond joint includes a dielectric-to-dielectric bond and a metal-to-metal bond; and
a continuous seal ring extending around a periphery of and at least to the bond joint, the continuous seal ring comprising a metallic material and sealing the bond joint between the first microelectronic component and the second microelectronic component.
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