US 12,321,611 B2
Memory device, memory system, and method of operating the memory system
Eun Chu Oh, Suwon-si (KR); Junyeong Seok, Suwon-si (KR); Younggul Song, Suwon-si (KR); and Byungchul Jang, Suwon-si (KR)
Assigned to SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed by SAMSUNG ELECTRONICS CO., LTD., Suwon-si (KR)
Filed on Nov. 9, 2022, as Appl. No. 18/053,850.
Claims priority of application No. 10-2021-0154256 (KR), filed on Nov. 10, 2021; and application No. 10-2022-0060427 (KR), filed on May 17, 2022.
Prior Publication US 2023/0141554 A1, May 11, 2023
Int. Cl. G06F 3/06 (2006.01); G06F 11/10 (2006.01)
CPC G06F 3/0619 (2013.01) [G06F 3/0644 (2013.01); G06F 3/0673 (2013.01); G06F 11/1068 (2013.01)] 20 Claims
OG exemplary drawing
 
1. A method of operating a memory system including a memory device and a memory controller, the method comprising:
programming, by the memory device, K logical pages stored in a page buffer circuit into a memory cell array to set a threshold voltage distribution for the memory cell array;
reading, by the memory device, the K logical pages programmed into the memory cell array into the page buffer circuit after a first delay time elapses;
correcting, by the memory controller, errors in the read K logical pages to generate error-corrected K logical pages;
transmitting, by the memory controller, N−K logical pages to the memory device;
combining the error-corrected K logical pages and the N−K logical pages to generate N logical pages;
programming, by the memory device, the N logical pages into the memory cell array to adjust the threshold voltage distribution,
wherein K is a positive integer and N is a positive integer greater than K.