US 12,321,607 B2
Memory device and method for operating the same
Po-Hao Tseng, Taichung (TW); Feng-Min Lee, Hsinchu (TW); Tian-Cih Bo, Zhubei (TW); and Ming-Hsiu Lee, Hsinchu (TW)
Assigned to MACRONIX INTERNATIONAL CO., LTD., Hsinchu (TW)
Filed by MACRONIX INTERNATIONAL CO., LTD., Hsinchu (TW)
Filed on Dec. 21, 2022, as Appl. No. 18/069,255.
Claims priority of provisional application 63/359,890, filed on Jul. 11, 2022.
Prior Publication US 2024/0012567 A1, Jan. 11, 2024
Int. Cl. G11C 7/02 (2006.01); G06F 3/06 (2006.01)
CPC G06F 3/0614 (2013.01) [G06F 3/0659 (2013.01); G06F 3/0673 (2013.01)] 18 Claims
OG exemplary drawing
 
1. A memory device, comprising:
a plurality of channel layers;
a plurality of word lines;
a plurality of memory layers disposed between the channel layers and the word lines; and
a plurality of memory cells defined at cross-points of the channel layers and the word lines;
wherein the memory device is configured for performing a first operation for m times and a second operation for n times, and m is equal to or larger than n, wherein in the first operation, a first electric field is produced in a portion of the memory layers, and wherein the word lines are configured for producing a second electric field in the second operation in the portion of the memory layers, and a field direction of the second electric field is different from a field direction of the first electric field,
wherein in the second operation, the second electric field is produced by a first voltage applied to one of the word lines that corresponds to the portion of the memory layers and a second voltage applied to another one of the word lines that corresponds the portion.