US 12,320,827 B2
Test socket and method of fabricating the same
Seungha Baek, Busan (KR)
Assigned to LEENO INDUSTRIAL INC., Busan (KR)
Appl. No. 17/769,791
Filed by LEENO INDUSTRIAL INC., Busan (KR)
PCT Filed Jun. 22, 2021, PCT No. PCT/KR2021/007802
§ 371(c)(1), (2) Date Apr. 18, 2022,
PCT Pub. No. WO2022/005085, PCT Pub. Date Jan. 6, 2022.
Claims priority of application No. 10-2020-0079763 (KR), filed on Jun. 30, 2020.
Prior Publication US 2022/0357361 A1, Nov. 10, 2022
Int. Cl. G01R 1/04 (2006.01); G01R 3/00 (2006.01)
CPC G01R 1/0441 (2013.01) [G01R 3/00 (2013.01)] 6 Claims
OG exemplary drawing
 
1. A test socket supporting a probe, comprising:
a socket block of an insulating material, provided with a probe hole to accommodate the probe; and
a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole,
wherein at least a portion of the internal film is electrically isolated from the external film at a portion of the inner surface of the probe hole.