US 12,320,740 B2
Apparatus for acquiring polarized images
Hirohito Fujiwara, Tokyo (JP); and Ryokuhei Yamazaki, Tokyo (JP)
Assigned to HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo (JP)
Filed by HITACHI HIGH-TECH SCIENCE CORPORATION, Tokyo (JP)
Filed on Jan. 6, 2023, as Appl. No. 18/094,118.
Prior Publication US 2023/0296497 A1, Sep. 21, 2023
Int. Cl. G01N 21/21 (2006.01); G01N 1/44 (2006.01)
CPC G01N 21/21 (2013.01) [G01N 1/44 (2013.01)] 9 Claims
OG exemplary drawing
 
1. An apparatus for acquiring polarized images that is attached to a thermal analysis apparatus comprising a pair of sample containers housing a measurement sample and a reference sample, respectively, and a heating furnace surrounding the sample containers from outside, the heating furnace having a window or an opening through which at least the measurement sample is observable, the apparatus for acquiring the polarized images comprising:
an attachment section attached to the thermal analysis apparatus;
a light source;
a polarizer configured to be a polarizing filter that polarizes light emitted from the light source;
a camera; and
an analyzer configured to be a polarizing filter that polarizes light reflected from the measurement sample or the reference sample to enter the camera after the measurement sample or the reference sample is irradiated via the window or the opening with polarized light transmitted through the polarizer,
wherein a first optical path of the polarizer and a second optical path of the analyzer are not parallel and
wherein both the polarizer and the analyzer are configured to be rotatable such that the polarized images of the measurement sample and the reference sample in the thermal analysis apparatus via the window or the opening are selectively acquired without rotating the pair of sample containers.