CPC G11C 16/3459 (2013.01) [G11C 16/0483 (2013.01); G11C 16/08 (2013.01); G11C 16/10 (2013.01); G11C 16/24 (2013.01)] | 20 Claims |
1. A memory device, comprising:
memory cells;
a program operation performer configured to perform a verify operation and a program voltage apply operation, wherein the verify operation is performed to verify whether threshold voltages of the memory cells have reached threshold voltages corresponding to a target program state using a first verify voltage, a second verify voltage higher than the first verify voltage, and a third verify voltage higher than the second verify voltage, and wherein the program voltage apply operation is performed to apply a program voltage to a word line coupled in common to the memory cells based on a result of the verify operation; and
a program operation controller configured to control the program operation performer such that, during the program voltage apply operation, a precharge voltage is first applied to a second bit line coupled to a second memory cell having a threshold voltage that is higher than the second verify voltage and lower than or equal to a third verify voltage, among the memory cells, before a precharge voltage is applied to a first bit line coupled to a first memory cell having a threshold voltage that is higher than the first verify voltage and lower than or equal to the second verify voltage, among the memory cells.
|